Shenzhen Advanced Institute and others made progress in nanoscale thermal conductivity measurement


Thermal imaging, morphology and compositional phase distribution of skutterudite


Thermal conductivity distribution of skutterudite and its interface changes

Recently, researchers from the Shenzhen Institute of Advanced Technology of the Chinese Academy of Sciences and the University of Washington have made progress in the field of quantitative measurement of nanoscale transport properties. The results were published on the National Science Review on the basis of Quantitative nanoscale mapping of three-phase thermal conductivivities in filled skutterudites via scanning thermal microscopy.

Quantitative measurement of the nano-scale transport properties is an important goal of the national key research and development program of nanotechnology key projects. In the past more than 20 years, the rapid development of nanomaterials and structures has greatly improved the macroscopic properties of materials. This is particularly evident in the field of thermoelectricity. However, the improvement in the performance of nanostructured thermoelectric materials is due to the inability to accurately predict the thermoelectric properties of non-uniformly distributed thermoelectric materials. Realized in the context of measurement. It is currently not possible to quantitatively measure the local properties of a material at the nanoscale, and therefore it is not possible to directly relate the nanostructure to its macroscopic properties, and it is only possible to rely on theoretical and simulation guidelines for computational material science.

In the study, researchers used a scanning thermal imaging atomic force microscope (SThM) to quantitatively measure the local thermal conductivity of a three-phase structured skutterudite thermoelectric material, and determined the microdomain composition of the material through a backscattered electron microscope (BSE), and then passed the heat. The probes achieve the same local thermal imaging (SThM). In the past, SThM imaging has been affected by undulating topography. However, in this work, thermal imaging (SThM) is not associated with topography, and it has a one-to-one correspondence with compositional phase (BSE). This discovery is unprecedented. With the calibration of a series of standard samples, combined with finite element local heat transfer process simulation, the researchers determined the local thermal conductivity distribution of the material and accurately captured the changes at the two-phase interface.

This research has been supported by the national key research and development project nanotechnology key projects.

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